Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9824946 | Test architecture of semiconductor device, test system, and method of testing semicondurctor devices at wafer level | Young-Yong Byun, Chi-Wook Kim | 2017-11-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9824946 | Test architecture of semiconductor device, test system, and method of testing semicondurctor devices at wafer level | Young-Yong Byun, Chi-Wook Kim | 2017-11-21 |