Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9824946 | Test architecture of semiconductor device, test system, and method of testing semicondurctor devices at wafer level | Young-Yong Byun, Ho-Sung Song | 2017-11-21 |
CK
Chi-Wook Kim
Overall (2017): #463,762 of 506,227Top 95%
1
Patents 2017