Issued Patents 2017
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9831126 | Method of manufacturing semiconductor device, semiconductor substrate, and semiconductor device | — | 2017-11-28 |
| 9799506 | Breakdown voltage measuring method and method for manufacturing semiconductor device | — | 2017-10-24 |
| 9786819 | Semiconductor light emitting device | Masakazu Takao, Kazuhiko Senda | 2017-10-10 |
| 9647081 | Method for manufacturing silicon carbide semiconductor device | Keiji Wada, Takeyoshi Masuda | 2017-05-09 |
| 9640619 | Methods of manufacturing wide band gap semiconductor device and semiconductor module, and wide band gap semiconductor device and semiconductor module | — | 2017-05-02 |
| 9607905 | Method of measuring breakdown voltage of semiconductor element and method of manufacturing semiconductor element | Susumu Yoshimoto | 2017-03-28 |