Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9607905 | Method of measuring breakdown voltage of semiconductor element and method of manufacturing semiconductor element | Mitsuhiko Sakai | 2017-03-28 |
SY
Susumu Yoshimoto
Overall (2017): #228,556 of 506,227Top 50%
1
Patents 2017