Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9653404 | Overlay target for optically measuring overlay alignment of layers formed on semiconductor wafer | Yi-Jing Wang, En-Chiuan Liou, Mei-Chen Chen, Han-Lin Zeng, Chia-Hung Lin | 2017-05-16 |
| 9570130 | Memory system and memory physical layer interface circuit | Chih-Wei Chang, Gerchih Chou, Fu-Chin Tsai, Shih-Chang Chen | 2017-02-14 |