Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9784699 | Quantitative X-ray analysis—matrix thickness correction | Charalampos Zarkadas, Milen Gateshki, Alexander Kharchenko, Waltherus Van Den Hoogenhof, Petronella Emerentiana Hegeman | 2017-10-10 |