Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9784699 | Quantitative X-ray analysis—matrix thickness correction | Charalampos Zarkadas, Milen Gateshki, Alexander Kharchenko, Waltherus Van Den Hoogenhof, Dick Kuiper | 2017-10-10 |
| 9739730 | Quantitative X-ray analysis—multi optical path instrument | Gustaaf Christian Brons, Aleksandr Komelkov, Bruno A. R. Vrebos, Waltherus Van Den Hoogenhof, Charalampos Zarkadas | 2017-08-22 |