Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9851313 | Quantitative X-ray analysis—ratio correction | Waltherus Van Den Hoogenhof | 2017-12-26 |
| 9784699 | Quantitative X-ray analysis—matrix thickness correction | Milen Gateshki, Alexander Kharchenko, Waltherus Van Den Hoogenhof, Petronella Emerentiana Hegeman, Dick Kuiper | 2017-10-10 |
| 9739730 | Quantitative X-ray analysis—multi optical path instrument | Petronella Emerentiana Hegeman, Gustaaf Christian Brons, Aleksandr Komelkov, Bruno A. R. Vrebos, Waltherus Van Den Hoogenhof | 2017-08-22 |