Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9841436 | AM/FM measurements using multiple frequency of atomic force microscopy | Roger Proksch, Jason Bemis | 2017-12-12 |
| 9804193 | Metrological scanning probe microscope | Deron Walters, Jason Cleveland, Roger Proksch | 2017-10-31 |
| 9671424 | Methods and systems for optimizing frequency modulation atomic force microscopy | Peter Grutter, Yoichi Miyahara, William Paul, Antoine Roy-Gobeil | 2017-06-06 |