Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804193 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Roger Proksch | 2017-10-31 |
| 9689890 | Fully digitally controller for cantilever-based instruments | Roger Proksch, Dan Bocek, Todd Day, Mario Viani, Clint Callahan | 2017-06-27 |
| 9581616 | Modular atomic force microscope with environmental controls | Mario Viani, Roger Proksch, Maarten Rutgers, Jim Hodgson | 2017-02-28 |