Issued Patents 2017
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9841436 | AM/FM measurements using multiple frequency of atomic force microscopy | Jason Bemis, Aleksander Labuda | 2017-12-12 |
| 9804193 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Jason Cleveland | 2017-10-31 |
| 9696342 | Quantitative measurements using multiple frequency atomic force microscopy | Jason Bemis | 2017-07-04 |
| 9604846 | Thermal measurements using multiple frequency atomic force microscopy | Anil Gannepalli | 2017-03-28 |
| 9581616 | Modular atomic force microscope with environmental controls | Mario Viani, Maarten Rutgers, Jason Cleveland, Jim Hodgson | 2017-02-28 |