| 9823272 |
Wafer testing probe card |
Ming-Chi Chen, Tien-Chia Li, Dai-Jin Yeh, Chien-Kuei Wang |
2017-11-21 |
| 9746495 |
Probe device having spring probe |
Chien-Chou Wu |
2017-08-29 |
| 9651578 |
Assembly method of direct-docking probing device |
Chien-Chou Wu, Ming-Chi Chen, Chung-Che Li |
2017-05-16 |
| 9643271 |
Method for making support structure for probing device |
Kun-Han Hsieh, Huo-Kang Hsu, Kuan-Chun Chou, Chung-Tse Lee |
2017-05-09 |
| 9648757 |
Method for manufacturing space transformer by using carrier substrate made for chip package and provided with elongated contacts |
Chung-Tse Lee, Chien-Chou Wu |
2017-05-09 |
| 9638716 |
Positioner of probe card and probe head of probe card |
Tzu-Yang Chen, Shang-Jung Hsieh, Chung-Tse Lee, Tien-Chia Li, Chia-Yuan Kuo +1 more |
2017-05-02 |
| 9618536 |
Probe needle and probe module using the same |
Chia-Yuan Kuo, Tien-Chia Li, Ming-Chi Chen, Chien-Chou Wu |
2017-04-11 |
| 9588141 |
Probe device having spring probe |
Chien-Chou Wu, Tien-Chia Li, Ting-Hsin KUO |
2017-03-07 |
| 9535092 |
Spring probe |
Ting-Hsin KUO, Tien-Chia Li, Yi-Lung Lee, Chien-Chou Wu |
2017-01-03 |