Issued Patents 2017
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9823272 | Wafer testing probe card | Ming-Chi Chen, Tien-Chia Li, Dai-Jin Yeh, Chien-Kuei Wang | 2017-11-21 |
| 9746495 | Probe device having spring probe | Chien-Chou Wu | 2017-08-29 |
| 9651578 | Assembly method of direct-docking probing device | Chien-Chou Wu, Ming-Chi Chen, Chung-Che Li | 2017-05-16 |
| 9643271 | Method for making support structure for probing device | Kun-Han Hsieh, Huo-Kang Hsu, Kuan-Chun Chou, Chung-Tse Lee | 2017-05-09 |
| 9648757 | Method for manufacturing space transformer by using carrier substrate made for chip package and provided with elongated contacts | Chung-Tse Lee, Chien-Chou Wu | 2017-05-09 |
| 9638716 | Positioner of probe card and probe head of probe card | Tzu-Yang Chen, Shang-Jung Hsieh, Chung-Tse Lee, Tien-Chia Li, Chia-Yuan Kuo +1 more | 2017-05-02 |
| 9618536 | Probe needle and probe module using the same | Chia-Yuan Kuo, Tien-Chia Li, Ming-Chi Chen, Chien-Chou Wu | 2017-04-11 |
| 9588141 | Probe device having spring probe | Chien-Chou Wu, Tien-Chia Li, Ting-Hsin KUO | 2017-03-07 |
| 9535092 | Spring probe | Ting-Hsin KUO, Tien-Chia Li, Yi-Lung Lee, Chien-Chou Wu | 2017-01-03 |