Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9823272 | Wafer testing probe card | Ming-Chi Chen, Dai-Jin Yeh, Tsung-Yi Chen, Chien-Kuei Wang | 2017-11-21 |
| 9638716 | Positioner of probe card and probe head of probe card | Tzu-Yang Chen, Shang-Jung Hsieh, Chung-Tse Lee, Tsung-Yi Chen, Chia-Yuan Kuo +1 more | 2017-05-02 |
| 9618536 | Probe needle and probe module using the same | Chia-Yuan Kuo, Ming-Chi Chen, Chien-Chou Wu, Tsung-Yi Chen | 2017-04-11 |
| 9588141 | Probe device having spring probe | Tsung-Yi Chen, Chien-Chou Wu, Ting-Hsin KUO | 2017-03-07 |
| 9535092 | Spring probe | Ting-Hsin KUO, Tsung-Yi Chen, Yi-Lung Lee, Chien-Chou Wu | 2017-01-03 |