Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9823272 | Wafer testing probe card | Tien-Chia Li, Dai-Jin Yeh, Tsung-Yi Chen, Chien-Kuei Wang | 2017-11-21 |
| 9651578 | Assembly method of direct-docking probing device | Chien-Chou Wu, Tsung-Yi Chen, Chung-Che Li | 2017-05-16 |
| 9618536 | Probe needle and probe module using the same | Chia-Yuan Kuo, Tien-Chia Li, Chien-Chou Wu, Tsung-Yi Chen | 2017-04-11 |