Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9805826 | Method and apparatus for testing integrated circuit | Weiwei Sang | 2017-10-31 |
| 9748970 | Built-in-self-test circuit for sigma-delta modulator | Zhou Fang, Song Huang, Chao Liang, Yifeng Liu | 2017-08-29 |
| 9726724 | On-chip current test circuit | Xiuqiang Xu, Yin Guo, Shayan Zhang, Xu Zhang, Yizhong Zhang | 2017-08-08 |
| 9551749 | Test circuit for very low voltage and bias scan testing of integrated circuit | Huangsheng Ding, Jianzhou Wu | 2017-01-24 |