Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9817601 | Method and apparatus for determining feasibility of memory operating condition change using different back bias voltages | Nihaar N. Mahatme, Rakesh Pandey | 2017-11-14 |
| 9726724 | On-chip current test circuit | Xiuqiang Xu, Yin Guo, Wanggen Zhang, Xu Zhang, Yizhong Zhang | 2017-08-08 |
| 9691495 | Memory array with RAM and embedded ROM | Jianan Yang, Scott I. Remington | 2017-06-27 |
| 9612653 | Integrated circuit with selectable power-on reset mode | Wen Gu, Jing Cui | 2017-04-04 |