Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9551749 | Test circuit for very low voltage and bias scan testing of integrated circuit | Wanggen Zhang, Jianzhou Wu | 2017-01-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9551749 | Test circuit for very low voltage and bias scan testing of integrated circuit | Wanggen Zhang, Jianzhou Wu | 2017-01-24 |