Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9711326 | Test structure for electron beam inspection and method for defect determination using electron beam inspection | Kuan-Chun Lin, Shih-Cheng Chen, Chung-Chih Hung, Yung-Teng Tsai, Chi-Hung Chan | 2017-07-18 |
| 9632971 | Method of handling transmission in data transmission system | Cheok Yan Goh, Yu-Hsun Chen, Mao-Lin Wu, Ching-Hwa Yu | 2017-04-25 |