Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9800259 | Digital to analog converter for performing digital to analog conversion with current source arrays | Fang-Ting Chou | 2017-10-24 |
| 9711326 | Test structure for electron beam inspection and method for defect determination using electron beam inspection | Kuan-Chun Lin, Chih-Chieh Chou, Shih-Cheng Chen, Yung-Teng Tsai, Chi-Hung Chan | 2017-07-18 |
| 9641015 | Charging structure | Yi-An Chen | 2017-05-02 |