Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9784987 | Apodization for pupil imaging scatterometry | Andrew V. Hill, Amnon Manassen, Barak Bringoltz, Ohad Bachar, Zeev Bomzon +1 more | 2017-10-10 |
| 9702693 | Apparatus for measuring overlay errors | Michael Adel, Walter D. Mieher, Ady Levy, Dan Wack | 2017-07-11 |