Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9852881 | Scanning electron microscope system, pattern measurement method using same, and scanning electron microscope | Chie Shishido, Shinya Yamada, Maki Tanaka | 2017-12-26 |
| 9582893 | Motion vector detector, distance detector, motion vector detection method and computer program product | Nao Mishima | 2017-02-28 |
| 9536700 | Sample observation device | Yasunori Goto | 2017-01-03 |