Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9739824 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Ernest Y. Wu +1 more | 2017-08-22 |
| 9557378 | Method and structure for multi-core chip product test and selective voltage binning disposition | Jeanne P. Bickford, Vikram Iyengar, Rahul K. Nadkarni | 2017-01-31 |