Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9646379 | Detection of selected defects in relatively noisy inspection data | Haiguang Chen, Stephen Biellak, Jaydeep Sinha | 2017-05-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9646379 | Detection of selected defects in relatively noisy inspection data | Haiguang Chen, Stephen Biellak, Jaydeep Sinha | 2017-05-09 |