Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9853123 | Semiconductor structure and fabrication method thereof | Kuo-Chin Hung, Wei-Chuan Tsai | 2017-12-26 |
| 9711326 | Test structure for electron beam inspection and method for defect determination using electron beam inspection | Chih-Chieh Chou, Shih-Cheng Chen, Chung-Chih Hung, Yung-Teng Tsai, Chi-Hung Chan | 2017-07-18 |