Issued Patents 2017
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9847347 | Semiconductor structure including a first transistor at a semiconductor-on-insulator region and a second transistor at a bulk region and method for the formation thereof | Nilesh Kenkare, Nigel Chan | 2017-12-19 |
| 9793372 | Integrated circuit including a dummy gate structure and method for the formation thereof | Jan Hoentschel, Nigel Chan, Sven Beyer | 2017-10-17 |
| 9768084 | Inline monitoring of transistor-to-transistor critical dimension | Nigel Chan | 2017-09-19 |
| 9698179 | Capacitor structure and method of forming a capacitor structure | Sven Beyer, Jan Hoentschel, Alexander Ebermann | 2017-07-04 |
| 9685336 | Process monitoring for gate cut mask | Nigel Chan | 2017-06-20 |
| 9666052 | Portable environment monitoring and early warning system for babies | — | 2017-05-30 |
| 9633857 | Semiconductor structure including a trench capping layer and method for the formation thereof | Steffen Sichler | 2017-04-25 |
| 9608112 | BULEX contacts in advanced FDSOI techniques | Sven Beyer, Tom Hasche, Jan Hoentschel | 2017-03-28 |
| 9590118 | Wafer with SOI structure having a buried insulating multilayer structure and semiconductor device structure | Sven Beyer, Nigel Chan, Jan Hoentschel | 2017-03-07 |