Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9696347 | Testing apparatus and method for microcircuit and wafer level IC testing | John DeBauche, Dan Campion, Michael Andres, Steve Rott, Jeffrey C. Sherry +1 more | 2017-07-04 |