Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9696347 | Testing apparatus and method for microcircuit and wafer level IC testing | John DeBauche, Dan Campion, Michael Andres, Steve Rott, Brian Halvorson +1 more | 2017-07-04 |
| 9678106 | Electrically conductive pins for microcircuit tester | John E. Nelson, Brian Warwick, Gary W. Michalko | 2017-06-13 |
| 9606143 | Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing | — | 2017-03-28 |