Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804194 | Low resistance low wear test pin for test contactor | — | 2017-10-31 |
| 9696347 | Testing apparatus and method for microcircuit and wafer level IC testing | John DeBauche, Dan Campion, Steve Rott, Jeffrey C. Sherry, Brian Halvorson +1 more | 2017-07-04 |
| 9638714 | On-center electrically conductive pins for integrated testing | David A. Johnson, John E. Nelson, Sarosh Patel | 2017-05-02 |