| 9785862 |
System and method for feeling surface roughness through microscopic data |
Aleksandr Y. Aravkin, Dimitri Kanevsky, Tara N. Sainath |
2017-10-10 |
| 9773909 |
Silicon-containing, tunneling field-effect transistor including III-N source |
Bahman Hekmatshoartabari, Davood Shahrjerdi |
2017-09-26 |
| 9748357 |
III-V MOSFET with strained channel and semi-insulating bottom barrier |
Guy M. Cohen, Amlan Majumdar |
2017-08-29 |
| 9716150 |
Device isolation for III-V substrates |
Guy M. Cohen |
2017-07-25 |
| 9698046 |
Fabrication of III-V-on-insulator platforms for semiconductor devices |
Bahman Hekmatshoartabari, Ali Khakifirooz, Davood Shahrjerdi |
2017-07-04 |
| 9666684 |
III-V semiconductor device having self-aligned contacts |
Amlan Majumdar, Yanning Sun |
2017-05-30 |
| 9653606 |
Fabrication process for mitigating external resistance of a multigate device |
Guy M. Cohen, Amlan Majumdar |
2017-05-16 |
| 9564514 |
Reducing direct source-to-drain tunneling in field effect transistors with low effective mass channels |
Amlan Majumdar, Jeffrey W. Sleight |
2017-02-07 |
| 9553015 |
Fabrication of III-V-on-insulator platforms for semiconductor devices |
Bahman Hekmatshoartabari, Ali Khakifirooz, Davood Shahrjerdi |
2017-01-24 |
