Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9576863 | Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness | Shawn A. Adderly, Kyle Babinski, Daniel A. Delibac, David A. DeMuynck, Matthew D. Moon +2 more | 2017-02-21 |