Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9576863 | Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness | Shawn A. Adderly, Kyle Babinski, David A. DeMuynck, Shawn R. Goddard, Matthew D. Moon +2 more | 2017-02-21 |