Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9536170 | Measurement method, image processing device, and charged particle beam apparatus | Takeyoshi Ohashi, Junichi Tanaka, Hiroyuki Shindo, Hiroki Kawada | 2017-01-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9536170 | Measurement method, image processing device, and charged particle beam apparatus | Takeyoshi Ohashi, Junichi Tanaka, Hiroyuki Shindo, Hiroki Kawada | 2017-01-03 |