CF

Chung-Hua Fu

HE Hermes-Epitek: 1 patents #3 of 7Top 45%
Overall (2017): #465,782 of 506,227Top 95%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9551569 Apparatus and method for curvature and thin film stress measurement Chung-Yuan Wu, Robert J. Champetier, Bu-Chin Chung 2017-01-24