Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9835685 | Test circuit and method for controlling test circuit | Gen Oshiyama, Osamu Moriyama, Iwao Yamazaki, Akihiro Chiyonobu | 2017-12-05 |
| 9823291 | Semiconductor device and method of testing semiconductor device | Tatsumi Nakada | 2017-11-21 |
| 9797949 | Test circuit and method of controlling test circuit | Gen Oshiyama, Osamu Moriyama, Akihiro Chiyonobu, Iwao Yamazaki | 2017-10-24 |
| 9746878 | Semiconductor device and method of testing semiconductor device | Gen Oshiyama, Osamu Moriyama | 2017-08-29 |