Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9835685 | Test circuit and method for controlling test circuit | Takahiro Shikibu, Osamu Moriyama, Iwao Yamazaki, Akihiro Chiyonobu | 2017-12-05 |
| 9797949 | Test circuit and method of controlling test circuit | Osamu Moriyama, Takahiro Shikibu, Akihiro Chiyonobu, Iwao Yamazaki | 2017-10-24 |
| 9746878 | Semiconductor device and method of testing semiconductor device | Takahiro Shikibu, Osamu Moriyama | 2017-08-29 |