Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9835685 | Test circuit and method for controlling test circuit | Gen Oshiyama, Takahiro Shikibu, Osamu Moriyama, Iwao Yamazaki | 2017-12-05 |
| 9797949 | Test circuit and method of controlling test circuit | Gen Oshiyama, Osamu Moriyama, Takahiro Shikibu, Iwao Yamazaki | 2017-10-24 |
| 9691740 | Stacked semiconductor device and method of controlling thereof | Hironori Kawaminami | 2017-06-27 |