Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9508611 | Semiconductor inspection method, semiconductor inspection device and manufacturing method of semiconductor element | Yoshinobu Kimura, Natsuki Tsuno, Hiroya Ohta, Renichi Yamada, Hirotaka Hamamura +2 more | 2016-11-29 |
| 9428177 | Vehicle | — | 2016-08-30 |