Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9466101 | Detection of defects on wafer during semiconductor fabrication | Chun-Hsien Lin, Liu Bo-Tsun, Chin-Ti Ko, Wu Cheng-Hung, Peng Jui-Chun +3 more | 2016-10-11 |
| 9228827 | Flexible wafer leveling design for various orientation of line/trench | Heng-Hsin Liu, Jui-Chun Peng | 2016-01-05 |