Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9466101 | Detection of defects on wafer during semiconductor fabrication | Chun-Hsien Lin, Liu Bo-Tsun, Chin-Ti Ko, Kuo-Hung Chao, Peng Jui-Chun +3 more | 2016-10-11 |
WC
Wu Cheng-Hung
Overall (2016): #183,028 of 481,213Top 40%
1
Patents 2016