Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9279673 | Semiconductor device and method of calibrating warpage testing system to accurately measure semiconductor package warpage | WonJun Ko, SeungYong Chai, OhHan Kim, GwangTae Kim | 2016-03-08 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9279673 | Semiconductor device and method of calibrating warpage testing system to accurately measure semiconductor package warpage | WonJun Ko, SeungYong Chai, OhHan Kim, GwangTae Kim | 2016-03-08 |