Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9310320 | Based sampling and binning for yield critical defects | Raghav Babulnath, Kwok Ng, Lisheng Gao | 2016-04-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9310320 | Based sampling and binning for yield critical defects | Raghav Babulnath, Kwok Ng, Lisheng Gao | 2016-04-12 |