KN

Kwok Ng

KL Kla-Tencor: 1 patents #124 of 327Top 40%
📍 Milpitas, CA: #178 of 448 inventorsTop 40%
🗺 California: #22,912 of 57,791 inventorsTop 40%
Overall (2016): #321,235 of 481,213Top 70%
1
Patents 2016

Issued Patents 2016

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9310320 Based sampling and binning for yield critical defects Satya Kurada, Raghav Babulnath, Lisheng Gao 2016-04-12