Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9519033 | High throughput hot testing method and system for high-brightness light-emitting diodes | — | 2016-12-13 |
| 9377414 | EUV high throughput inspection system for defect detection on patterned EUV masks, mask blanks, and wafers | Yung-Ho Alex Chuang, David Shafer, Bin-Ming Benjamin Tsai, David L. Brown | 2016-06-28 |