Issued Patents 2016
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9494856 | Method and system for fast inspecting defects | Jack Jau | 2016-11-15 |
| 9436988 | Method and system of classifying defects on a wafer | Zhaoli Zhang, Jack Jau | 2016-09-06 |
| 9282293 | Method and system for measuring critical dimension and monitoring fabrication uniformity | Jack Jau, Hong Xiao | 2016-03-08 |
| 9251581 | Methods for promoting semiconductor manufacturing yield and classifying defects during fabricating a semiconductor device, and computer readable mediums encoded with a computer program implementing the same | Shih-Tsung Chen, Yu Fu, Futang Peng, Zhao-Li Zhang | 2016-02-02 |