Jack Jau — 5 Patents at Hermes Microvision

Issued Patents 2016

Showing 1–5 of 5 patents

Patent #	Title	Co-Inventors	Date
9494856	Method and system for fast inspecting defects	Wei Fang	2016-11-15
9436988	Method and system of classifying defects on a wafer	Wei Fang, Zhaoli Zhang	2016-09-06
9400176	Dynamic focus adjustment with optical height detection apparatus in electron beam system	Joe Wang, Van-Duc Nguyen, Yi Wang, Zhong-Wei Chen	2016-07-26
9362087	Charged particle beam apparatus	Zhongwei Chen, Weiming Ren	2016-06-07
9282293	Method and system for measuring critical dimension and monitoring fabrication uniformity	Wei Fang, Hong Xiao	2016-03-08