| 9513335 |
Method for using XOR trees for physically efficient scan compression and decompression logic |
Steev Wilcox, Brian Foutz, Paul Alexander Cunningham, Krishna Vijaya Chakravadhanula |
2016-12-06 |
| 9501590 |
Systems and methods for testing integrated circuit designs |
Paul Alexander Cunningham, Steev Wilcox |
2016-11-22 |
| 9470754 |
Elastic compression-optimizing tester bandwidth with compressed test stimuli using overscan and variable serialization |
Krishna Vijaya Chakravadhanula, Brian Foutz, Steev Wilcox, Paul Alexander Cunningham, David G. Scott +2 more |
2016-10-18 |
| 9470755 |
Method for dividing testable logic into a two-dimensional grid for physically efficient scan |
Brian Foutz, Steev Wilcox, Krishna Vijaya Chakravadhanula, Paul Alexander Cunningham |
2016-10-18 |
| 9470756 |
Method for using sequential decompression logic for VLSI test in a physically efficient construction |
Steev Wilcox, Brian Foutz, Krishna Vijaya Chakravadhanula, Paul Alexander Cunningham |
2016-10-18 |
| 9465896 |
Systems and methods for testing integrated circuit designs |
Paul Alexander Cunningham, Steev Wilcox |
2016-10-11 |