Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9417287 | Scheme for masking output of scan chains in test circuit | Anshuman Chandra, Subramanian Chebiyam, Jyotirmoy Saikia, Parthajit Bhattacharya | 2016-08-16 |
| 9411014 | Reordering or removal of test patterns for detecting faults in integrated circuit | Sushovan Podder, Parthajit Bhattacharya | 2016-08-09 |
| 9342439 | Command coverage analyzer | Chandramouli Gopalakrishnan, Subramanian Chebiyam, Neeraj Surana, Santosh Kulkarni | 2016-05-17 |
| 9329235 | Localizing fault flop in circuit by using modified test pattern | Parthajit Bhattacharya | 2016-05-03 |
| 9239897 | Hierarchical testing architecture using core circuit with pseudo-interfaces | Subramanian Chebiyam, Santosh Kulkarni, Anshuman Chandra | 2016-01-19 |