Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9417287 | Scheme for masking output of scan chains in test circuit | Anshuman Chandra, Subramanian Chebiyam, Jyotirmoy Saikia, Rohit Kapur | 2016-08-16 |
| 9411014 | Reordering or removal of test patterns for detecting faults in integrated circuit | Sushovan Podder, Rohit Kapur | 2016-08-09 |
| 9329235 | Localizing fault flop in circuit by using modified test pattern | Rohit Kapur | 2016-05-03 |