Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9330988 | Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness | Shawn A. Adderly, Daniel A. Delibac, David A. DeMuynck, Shawn R. Goddard, Matthew D. Moon +2 more | 2016-05-03 |