Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9453873 | Non-planar field effect transistor test structure and lateral dielectric breakdown testing method | Fen Chen, Roger A. Dufresne, Michael A. Shinosky | 2016-09-27 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9453873 | Non-planar field effect transistor test structure and lateral dielectric breakdown testing method | Fen Chen, Roger A. Dufresne, Michael A. Shinosky | 2016-09-27 |